60,000 count, IP67 dust and water...
The Summit series semi-automated probe systems, with PureLine™ and AttoGuard® technologies, allow you to access the full range of your test instruments for wafers up to 200 mm.
The BlueRay™ probe systems ensure accurate and repeatable test results for wafer-level functional test of discrete devices.
The PM300 Analytical Probe System is the industry benchmark in manual semiconductor failure analysis and in-process testing.
The PA300 is a precise and flexible semi-automated test solution for wafers and substrates up to 300 mm.