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The FLIR DM284 Imaging Multimeter...
The MPS150 is an easy to use, yet highly-precise manual probe platform for wafers and substrates up to 150 mm.
The PM8 probe system is the benchmark in manual failure analysis and in-process testing.
The Summit series semi-automated probe systems, with PureLine™ and AttoGuard® technologies, allow you to access the full range of your test instruments for wafers up to 200 mm.
The BlueRay™ probe systems ensure accurate and repeatable test results for wafer-level functional test of discrete devices.
The Cascade Microtech CM300xi with Contact Intelligence technology meets the measurement challenges brought on by extremely complex environments.
The PM300 Analytical Probe System is the industry benchmark in manual semiconductor failure analysis and in-process testing.
The PA300 is a precise and flexible semi-automated test solution for wafers and substrates up to 300 mm.