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True RMS MultiMeter & Clamp meter kit
The MPS150 is an easy to use, yet highly-precise manual probe platform for wafers and substrates up to 150 mm.
The BlueRay™ probe systems ensure accurate and repeatable test results for wafer-level functional test of discrete devices.
The Cascade Microtech CM300xi with Contact Intelligence technology meets the measurement challenges brought on by extremely complex environments.
The PA300 is a precise and flexible semi-automated test solution for wafers and substrates up to 300 mm.
The PM300 Analytical Probe System is the industry benchmark in manual semiconductor failure analysis and in-process testing.
The PM8 probe system is the benchmark in manual failure analysis and in-process testing.
The Summit series semi-automated probe systems, with PureLine™ and AttoGuard® technologies, allow you to access the full range of your test instruments for wafers up to 200 mm.