Cascade Microtech Summit Semi-automated Probe System View larger

FormFactor Summit Semi-automated Probe System

Summit

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The Summit series semi-automated probe systems, with PureLine™ and AttoGuard® technologies, allow you to access the full range of your test instruments for wafers up to 200 mm.

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Precise On-Wafer Device and Process Characterization

The Summit series semi-automated probe systems, with PureLine™ and AttoGuard® technologies, allow you to access the full range of your test instruments for wafers up to 200 mm. Whatever your application: RF/Microwave, device characterization,  wafer-level reliability, e-test, modeling or yield enhancement, the Summit leads the industry in on-wafer measurements. Summit series probe systems are easy to configure with your choice of measurement performance, chuck size, thermal range and microscope options. All platforms are -60°C to 300°C compatible to ensure an upgrade path to meet your future needs. Cascade Microtech provides many accessories for the Summit for a wide range of applications to suit your unique wafer probing test needs.

Features and Benefits

  • High-precision wafer probe station for device characterization and modeling
  • Re-configurable for multiple applications: DC, RF, mmW, FA, WLR and more
  • Excellent EMI shielding for low noise measurement
  • Wide range of temperature options from -60 to 300°C and higher

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