This product is no longer in stock
The Summit series semi-automated probe systems, with PureLine™ and AttoGuard® technologies, allow you to access the full range of your test instruments for wafers up to 200 mm. Whatever your application: RF/Microwave, device characterization, wafer-level reliability, e-test, modeling or yield enhancement, the Summit leads the industry in on-wafer measurements. Summit series probe systems are easy to configure with your choice of measurement performance, chuck size, thermal range and microscope options. All platforms are -60°C to 300°C compatible to ensure an upgrade path to meet your future needs. Cascade Microtech provides many accessories for the Summit for a wide range of applications to suit your unique wafer probing test needs.