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The BlueRay™ probe systems ensure accurate and repeatable test results for wafer-level functional test of discrete devices. With the MultiDie Testing™ technology, the BlueRay is able to test up to 70,000 LEDs per hour, three times more than any other solution available.
The PA200 BlueRay semi-automatic probe system enables high-throughput benchtop testing. This system can be easily upgraded in the field by simply docking a wafer-handling robot. Testing applications developed in the lab on the semi-automatic version of BlueRay can be easily transferred to the production test floor using the same probing platform, resulting in less changeover costs and capital investment.
The BlueRay probe system enables highly accurate testing of any optoelectronic, MEMS or RF device, and ensures high mean-time between failures (MTBF) for reliable, on-wafer probing. For testing devices under thermal stress, the system can be equipped with a thermal chuck.
For measurements requiring backside access to the wafer, the PA200DS BlueRay provides access to both sides of the wafer, allowing an integrating sphere to be placed below an LED substrate for highly accurate light measurement.