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The PM300 Analytical Probe System is the industry benchmark in manual semiconductor failure analysis and in-process testing.
Its versatility meets a wide range of probing applications from analytical to pilot production, incorporating a round chuck for wafer tests or a square chuck for applications such as Flat Panel Display.
Flexibility in optics and accessories enables system configurations according to actual needs and budget constraints.
The PM300PS manual analytical probe system creates a measurement environment free from electromagnetic (EMI) and radio-frequency interference (RFI) for device characterization and modeling, process development, wafer-level reliability and failure analysis and 3D IC engineering test. ProbeShield® Technology enhances your device and process development, reducing feedback times and design iterations to gain the efficiencies needed for a faster time to market and higher return on investment. This can only be accomplished with ProbeShield Technology's superior measurement accuracy, precise positioning accuracy and intelligent hardware and software systems, which eliminate wasted time and costly errors.