Cascade Microtech PA300 Semi-automatic Probe System View larger

FormFactor PA300 Semi-automatic Probe System

PA300

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The PA300 is a precise and flexible semi-automated test solution for wafers and substrates up to 300 mm.

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Highest Positioning Accuracy for 300 mm Testing

Rigorous research and development resulted in a high-precision probe system, which is manufactured using highly-skilled labor and quality components. Whether it be failure analysis or device characterization and modeling, the PA300 is perfect for testing devices from DC to RF/microwave.

The powerful Velox™ probe station control software features easy on-screen navigation, wafer mapping, automation and seamless integration with analyzers and measurement software. It enables simple operation of motorized positioners and thermal systems.

Features and Benefits

  • Best probe station for testing up to 300 mm
  • Ideal for failure analysis and device characterization and modeling (DC to RF/microwave)
  • Submicron probing capability
  • Intuitive, user-friendly control system
  • Vast array of accessories for a complete, customized test solution

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