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Rigorous research and development resulted in a high-precision probe system, which is manufactured using highly-skilled labor and quality components. Whether it be failure analysis or device characterization and modeling, the PA300 is perfect for testing devices from DC to RF/microwave.
The powerful Velox™ probe station control software features easy on-screen navigation, wafer mapping, automation and seamless integration with analyzers and measurement software. It enables simple operation of motorized positioners and thermal systems.