Keysight B2902A Precision Source/Measure Unit, 2 Channel, 100fA


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The Keysight B2902A Precision Source / Measure Unit (SMU) is a 2-channel, compact and cost-effective bench-top SMU with the capability to source and measure both voltage and current.

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$13,753.00 tax excl.

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The Keysight B2900A Series of Precision Source/Measure Units are compact and cost-effective bench-top Source/Measure Units (SMUs) with the capability to source and measure both voltage and current. These capabilities make the B2900A Series ideal for a wide variety of IV (current versus voltage) measurement tasks that require both high resolution and accuracy.

The Keysight B2900A Series of SMUs provide best-in-class performance for a modest price. They have broad voltage (±210 V) and current (± 3 A DC and ±10.5 A pulsed) sourcing capability, excellent precision (minimum 10 fA/100 nV sourcing and measuring resolution) and possess a superior color LCD graphical user interface (GUI). In addition, several task-based viewing modes dramatically improve productivity for test, debug and characterization.

The Keysight B2900A Series offers unmatched measurement throughput and supports conventional SMU SCPI commands for easy test code migration. These features improve efficiency and lower the cost of ownership when integrating the SMUs into systems for production test.


The Keysight B2900A Series consists of four models, the B2901A, B2902A, B2911A and B2912A, differentiated through their available features (number of digits displayed, measurement resolution, minimum timing interval, supported viewing modes, etc.) and by the number of SMU channels (one or two) they contain. This makes it easy to select the exact price/performance point you require to meet your testing needs.

Keysight Source Measure Units


The best SMU solution for a broad range of IV measurements

IV measurements

Testing semiconductors, discrete and passive components
Diodes, laser diodes, LEDs Photodetectors, sensors
Field effect transistors (FETs), bipolar junction transistors (BJTs)
ICs (analog ICs, RFICs, MMICs, etc)
Resistor, varistor, thermistors, switches

Testing precision electronics and green energy devices
Photovoltaic cells
Power transistors, power devices
Medical instruments
Power and DC bias source for circuit test

Research and education
New material investigations
Nano devices characterization (e.g. CNT)
Giant magnetic resistance (GMR)
Organic devices
Any precise voltage/current source and measurement

Integrated source and measurement capabilities simplify difficult IV measurement tasks


Performing IV measurements with conventional instruments such as voltage/current sources, arbitrary waveform generators (AWGs), switches, and voltage/current meters is complicated and confusing. It requires deep technical knowledge of both the measurement technique
and the instrumentation to perform an accurate measurement.

The Keysight B2900A SMU integrates many different source and measurement capabilities into one compact form factor. It can operate as a seamless 4-quadrant precision voltage/current source, an electrical load, an accurate voltage/current meter, a pulse generator and an AWG.
Its versatile all-in-one integrated source and measurement capabilities allow it to perform a wide variety of measurements from DC to low frequency AC without the need to change connections or use additional equipment.

Moreover, the availability of 2-channel models supports the testing of devices with up to three terminals (as long as one terminal can be tied to the circuit common).

Keysight SMU



Test up to 210 V and 3 A (DC) or 10.5A (pulsed) with a single instrument

The B2900A SMUs can source and measure voltages of ±210 V and currents of ±3 A (DC) or ±10.5 A (pulsed).This versatility allows you to standardize on a single SMU model and minimize support costs.


These capabilities are present on both single and dual channel versions, since on the 2-channel versions both channels can be operated completely independently.

Wavegen Capabilities




















Integrated sweep and arbitrary waveform measurement functionality

The Keysight B2900A Series has capabilities that allow it to perform more than just simple DC and pulsed measurements. The B2900A SMUs have a built-in sweep capability that supports all of the standard sweep parameters such as linear
and logarithmic modes, single and double sweep functions and constant and pulsed sweep operation.

The B2900A GUI fully supports the sweep measurement function, thereby allowing sweep measurements to be made and displayed quickly from the instrument front panel. Of course, the user can also make the same sweep measurements just as effi ciently on the B2900A SMUs
under remote control using SCPI commands.


This integrated sweep measurement capability improves efficiency and reduces measurement setup time. In addition to its resident sweep functionality, the Keysight B2900A Series also supports arbitrary waveform generation (AWG) and list sweep capabilities. The AWG and list sweep functions allow you to create waveforms with up to 2500 steps for maximum flexibility, and enable you to specify a waveform of arbitrary shape using familiar spreadsheet compatible data-entry formats. The AWG and list sweep features are especially useful when characterizing devices where the response varies greatly depending upon the applied voltage or current, since they give you the flexibility to “zoom in” on areas of interest.


Source and measurement resolution down to 10 fA and 100 nV

The Keysight B2900A Series consists of four models primarily differentiated by number of channels (one or two) and measurement and sourcing resolution. The B2901A (single channel) and B2902A (dual channel) versions possess 100 fA and 100 nV measurement resolution and 1 pA and 1 μV sourcing resolution.


The B2911A (single channel) and B2912A (dual channel) precision versions possess 10 fA and 100 nV of resolution for both measurement and sourcing. All members of the Keysight B2900A Series support popular banana jack style inputs for cost-effective and flexible connectivity; for low-current measurements below 1 nA, banana jack to triaxial adapters are available.

B2900A Resolution


Capture transient phenomena effortlessly

Keysight B2900A Series supports a high speed sampling measurement function that permits the capture and display of low frequency transient phenomena. The Keysight B2901A and B2902A support a 20 μs (50,000 points/s) sampling rate and the Keysight B2911A and B2912A support a 10 μs (100,000 points/s) sampling rate. Of course, the maximum achievable sampling rate depends on many factors including signal level, ambient noise and desired resolution.

Roll Mode



Innovative GUI and 4.3” color LCD display facilitate fast bench-top test, debug and characterisation


Keysight B2900A Series


Free PC-based software eliminates the need to program

Keysight supplies PC-based Quick I/V Measurement Software with the B2900A Series at no charge. This software makes it easy to quickly setup and perform IV measurements and to display the measurement data in tables and graphs without the need to program. Using Quick IV you can control up to four SMUs, which is ideal for bench top characterization of four-terminal devices such as MOSFETs.

Easy web browser control

The Keysight B2900A Series has a built-in web server that allows it to be controlled using a web browser. This allows you to enjoy the convenience of external PC control without the need  for any special software. Simply connect your computer to the instrument via its LAN port, type in the IP address of the B2900A unit and begin making interactive measurements.

Remote Connections


Quick I/V Measurement Software enables fast and easy measurement from a PC


Keysight B2900A Quick I/V Measurement Software is furnished with the B2900A at no charge, and it permits easy measurement setup
and execution on a Windows-based PC. The software has a user-friendly GUI, and it can be used with all of the B2900A’s interfaces: LAN,
USB and GPIB. The software has the ability to control up to four SMUs total in any confi guration of single and dual channel units.


Measurement Application